Articles

Thin film filter performance for extreme ultraviolet and x-ray applications

[+] Author Affiliations
Forbes R. Powell

Consultant (USA)

Joakim F. Lindblom

Stanford Univ. (USA)

Stephen F. Powell

Consultant (USA)

Peter W. Vedder

Univ. of California/Berkeley (USA)

Opt. Eng. 29(6), 614-624 (Jun 01, 1990). doi:10.1117/12.55641
History: Online November 29, 2005
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Abstract

Abstract not available

© 2005 COPYRIGHT SPIE--The International Society for Optical Engineering.

Citation

Forbes R. Powell ; Joakim F. Lindblom ; Stephen F. Powell and Peter W. Vedder
"Thin film filter performance for extreme ultraviolet and x-ray applications", Opt. Eng. 29(6), 614-624 (Jun 01, 1990). ; http://dx.doi.org/10.1117/12.55641


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