© 2005 COPYRIGHT SPIE--The International Society for Optical Engineering.
John C. Brasunas and G. Mark Cushman
"Interferometric but nonspectroscopic technique for measuring the thickness of a transparent plate", Opt. Eng. 34(7), 2126-2130 (Jul 01, 1995). ; http://dx.doi.org/10.1117/12.206585
Your Session has timed out. Please sign back in to continue.
Sign In to Access Full Content
Sign in via: