Articles

Texture characterization and defect detection using adaptive wavelets

[+] Author Affiliations
Warren J. Jasper, Stephen J. Garnier, Harsh Potlapalli

North Carolina State University Department of Textile Engineering Raleigh, North Carolina 27695-8301

Opt. Eng. 35(11), 3140-3149 (Nov 01, 1996). doi:10.1117/1.601054
History: Received Oct. 19, 1995; Revised Apr. 12, 1996; Accepted June 4, 1996
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Abstract

Many textures such as woven fabrics and composites have a regular and repeating texture. This paper presents a new method to capture the texture information using adaptive wavelet bases. Wavelets are compact functions which can be used to generate a multiresolution analysis. Texture constraints are used to adapt the wavelets to better characterize specific textures. An adapted wavelet basis has very high sensitivity to the abrupt changes in the texture structure caused by defects. This paper demonstrates how adaptive wavelet basis can be used to locate defects in woven fabrics. © 1996 Society of Photo−Optical Instrumentation Engineers.


Citation

Warren J. Jasper ; Stephen J. Garnier and Harsh Potlapalli
"Texture characterization and defect detection using adaptive wavelets", Opt. Eng. 35(11), 3140-3149 (Nov 01, 1996). ; http://dx.doi.org/10.1117/1.601054


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