1 November 1996 Edge quality metric for arbitrary two-dimensional edges
Paul V. Khvorostov, Michael Braun, Colin S. Poon
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A quality metric for an arbitrary 2D edge contour is presented. This metric is constructed from measured physical characteristics of the edge. It enables a comparison of performance of different edge detecting algorithms and provides a tool for the optimization of edge detectors. The metric was verified using the Canny’s edge detector applied to a set of artificial images varying in image quality.
Paul V. Khvorostov, Michael Braun, and Colin S. Poon "Edge quality metric for arbitrary two-dimensional edges," Optical Engineering 35(11), (1 November 1996). https://doi.org/10.1117/1.601060
Published: 1 November 1996
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Cited by 1 scholarly publication and 1 patent.
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KEYWORDS
Sensors

Signal to noise ratio

Edge detection

Distance measurement

Convolution

Detection and tracking algorithms

Optical engineering

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