All-optical probing of material structure by second harmonic generation: application to piezoelectric aluminium nitride thin films

Daniele Blanc; Alain Cachard; Jean Claude Pommier

doi:10.1117/1.601240

1 April 1997 All-optical probing of material structure by second harmonic generation: application to piezoelectric aluminium nitride thin films

Daniele Blanc, Alain Cachard, Jean Claude Pommier

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Optical Engineering, Vol. 36, Issue 4, (April 1997). https://doi.org/10.1117/1.601240

Second-harmonic generation can be used to probe the microstructure of materials. This nondestructive all-optical method is applied to quantify the orientation of the aluminum nitride microcolumns. Theoretical results show that very small tilt angles of the columns are easily detectable. The sensitivity of this technique is confirmed by experimental results, which are compared with piezoelectric measurements

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Daniele Blanc, Alain Cachard, and Jean Claude Pommier "All-optical probing of material structure by second harmonic generation: application to piezoelectric aluminium nitride thin films," Optical Engineering 36(4), (1 April 1997). https://doi.org/10.1117/1.601240

Published: 1 April 1997

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