Polarization effects in speckle correlation metrology

Mike Adams; Klaus D. Hinsch; Falk Lange; Karin Wolff

doi:10.1117/1.601444

1 August 1997 Polarization effects in speckle correlation metrology

Mike Adams, Klaus D. Hinsch, Falk Lange, Karin Wolff

Optical Engineering, Vol. 36, Issue 8, (August 1997). https://doi.org/10.1117/1.601444

The recent use of single mode fibers in electronic speckle pattern interferometry (ESPI) shows that it is possible to produce a small and compact system for the use even in a hostile environment. Standard single mode fibers are easy to handle but cannot preserve the polarization state of the input light when ambient conditions change during long term measurements. The quality of the ESPI fringes decreases and the performance of the measuring system suffers. Under this point of view the correlation of speckle patterns produced by light of different polarization states is investigated.

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Mike Adams, Klaus D. Hinsch, Falk Lange, and Karin Wolff "Polarization effects in speckle correlation metrology," Optical Engineering 36(8), (1 August 1997). https://doi.org/10.1117/1.601444

Published: 1 August 1997

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