1 September 1997 New method of obtaining particle diameter by the fast Fourier transform pattern of the in-line hologram
Keishi Nishihara, Sachiko Hatano, Kunihito Nagayama
Author Affiliations +
A new method of determining particle diameter from a farfield in-line hologram is proposed. The method is based on the following properties of an in-line hologram of small particles. The fringe interval of the hologram decreases with radius from the symmetrical axis. Therefore, the corresponding spatial frequency continuously increases with radius. The Fourier transformed (FT) pattern of the hologram preserves the properties similar to those of the original fringe pattern. In the FT plane, the uniform background and scattering term contribute only to the very low frequency region. The interference term, therefore, can be figured out, and it is the only contribution to the higher frequency region. It is shown that the FT pattern has a white ring zone, which corresponds to the zero point of the envelope function of the original fringe pattern. Since the position of the ring contains information on the particle diameter, it is demonstrated that measurement of the diameter of this ring provides a powerful and reliable way of obtaining particle diameter.
Keishi Nishihara, Sachiko Hatano, and Kunihito Nagayama "New method of obtaining particle diameter by the fast Fourier transform pattern of the in-line hologram," Optical Engineering 36(9), (1 September 1997). https://doi.org/10.1117/1.601418
Published: 1 September 1997
Lens.org Logo
CITATIONS
Cited by 10 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Holograms

Particles

Fourier transforms

Spatial frequencies

Signal attenuation

Fringe analysis

Bessel functions

Back to Top