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Interferometric measurements of small-scale irregularities: highly reflecting surfaces

[+] Author Affiliations
Parameswaran Hariharan

CSIRO, Division of Telecommunications and Industrial Physics, P.O. Box 218, Lindfield, New South Wales?2070, Australia

Opt. Eng. 37(10), 2751-2753 (Oct 01, 1998). doi:10.1117/1.601814
History: Received Jan. 15, 1998; Revised Apr. 27, 1998; Accepted Apr. 28, 1998
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Abstract

With uncoated optical surfaces, it is possible to use a Fizeau interferometer to make direct measurements of small-scale irregularities with very small amplitudes. However, problems arise with highly reflecting surfaces. Some optical systems that can be used for such measurements are described. © 1998 Society of Photo-Optical Instrumentation Engineers.

© 1998 Society of Photo-Optical Instrumentation Engineers

Citation

Parameswaran Hariharan
"Interferometric measurements of small-scale irregularities: highly reflecting surfaces", Opt. Eng. 37(10), 2751-2753 (Oct 01, 1998). ; http://dx.doi.org/10.1117/1.601814


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