SAMPLED IMAGING SYSTEMS

Understanding image quality losses due to smear in high-resolution remote sensing imaging systems

[+] Author Affiliations
Steven L. Smith, James Mooney, Theodore A. Tantalo, Robert D. Fiete

Eastman Kodak Company, Commercial & Government Systems, 1447 St. Paul Street, Rochester, New York?14653-7225

Opt. Eng. 38(5), 821-826 (May 01, 1999). doi:10.1117/1.602054
History: Received Aug. 12, 1998; Accepted Aug. 25, 1998
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Abstract

Space-based high-resolution scanning array imaging systems have the potential to introduce large amounts of image smear. When designing these systems, it is useful to understand how smear will degrade image quality. A brief description of the causes of smear and a simple mathematical model are presented. A series of image simulations (for a system in which λFN/p=1.0, where λ is the mean wavelength for a panchromatic system, FN is the system f number, and p is the pixel pitch of the detectors) are performed in which along scan smear (ranging from 1.0 to 8.0 pixels) is introduced. Using the National Imagery Interpretability Rating Scale (NIIRS), expert observers rated ΔNIIRS difference in image quality between the images with simulated smear and the original “unsmeared” image. The functional relationship between smear error and image quality (in units of ΔNIIRS) is determined. © 1999 Society of Photo-Optical Instrumentation Engineers.

© 1999 Society of Photo-Optical Instrumentation Engineers

Citation

Steven L. Smith ; James Mooney ; Theodore A. Tantalo and Robert D. Fiete
"Understanding image quality losses due to smear in high-resolution remote sensing imaging systems", Opt. Eng. 38(5), 821-826 (May 01, 1999). ; http://dx.doi.org/10.1117/1.602054


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