Interference method for determination of the refractive index and thickness

Serguei A. Alexandrov; Igor V. Chernyh

doi:10.1117/1.1287583

1 September 2000 Interference method for determination of the refractive index and thickness

Serguei A. Alexandrov, Igor V. Chernyh

Optical Engineering, Vol. 39, Issue 9, (September 2000). https://doi.org/10.1117/1.1287583

The interference method for simultaneous measurement of the absolute refractive index and the thickness of plane parallel samples is developed. This method enables us to test solid (including optical glasses, crystals, plastics, and other sheet materials), liquid, and gaseous media over a wide spectral range. The experimental model for the realization of this method, the laser interference refractometer and thick- nessmeter (IRT), is manufactured and investigated. The IRT accuracy of the refractive index measurement is not worse than that of the best modern goniometers and the accuracy of the thickness measurement corresponds to the interference accuracy.

Citation Download Citation

Serguei A. Alexandrov and Igor V. Chernyh "Interference method for determination of the refractive index and thickness," Optical Engineering 39(9), (1 September 2000). https://doi.org/10.1117/1.1287583

Published: 1 September 2000

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available