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Interferometry

Interference method for determination of the refractive index and thickness

[+] Author Affiliations
Serguei A. Alexandrov

RBP Optoelectronics, Research Production Association, P.O. Box 223, 220012 Minsk, Belarus

Igor V. Chernyh

JSC Peleng, Makayonok Str. 23, 220023 Minsk, Belarus

Opt. Eng. 39(9), 2480-2486 (Sep 01, 2000). doi:10.1117/1.1287583
History: Received July 12, 1999; Revised Feb. 25, 2000; Accepted Mar. 20, 2000
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Abstract

The interference method for simultaneous measurement of the absolute refractive index and the thickness of plane parallel samples is developed. This method enables us to test solid (including optical glasses, crystals, plastics, and other sheet materials), liquid, and gaseous media over a wide spectral range. The experimental model for the realization of this method, the laser interference refractometer and thicknessmeter (IRT), is manufactured and investigated. The IRT accuracy of the refractive index measurement is not worse than that of the best modern goniometers and the accuracy of the thickness measurement corresponds to the interference accuracy. © 2000 Society of Photo-Optical Instrumentation Engineers.

© 2000 Society of Photo-Optical Instrumentation Engineers

Citation

Serguei A. Alexandrov and Igor V. Chernyh
"Interference method for determination of the refractive index and thickness", Opt. Eng. 39(9), 2480-2486 (Sep 01, 2000). ; http://dx.doi.org/10.1117/1.1287583


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