Thin Films

Comparison of Kretschmann-Raether configuration angular and thickness regimes with phase-difference shift for measuring changes in refractive index

[+] Author Affiliations
Kun-Huang Chen

Feng Chia University, Department of Electrical Engineering, 100 Wenhwa Road, Seatwen,, Taichung 40724, Taiwan

Jing-Heng Chen

Feng Chia University, Department of Photonics, 100 Wenhwa Road, Seatwen, Taichung 40724, Taiwan

Jiun-You Lin

National Changua University of Education, Department of Mechatronics Engineering, No. 2, Shi-Da Road, Changhua City 50074, Taiwan

Opt. Eng. 45(2), 023803 (February 14, 2006). doi:10.1117/1.2172346
History: Received March 06, 2005; Accepted July 18, 2005; Published February 14, 2006
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We derive the phase difference equation between the p- and s-polarizations of reflection light based on the Kretschmann-Raether configuration. This phase difference equation is used to examine the relationship of the incident angle and metal film thickness versus the phase differences under a small refractive index variation. For a fixed incident angle, the phase difference has a higher measurement sensitivity than the reflectivity change. At the critical angle, there is a higher sensitivity when the metal film thickness is smaller than the skin depth. The surface plasmon resonant (SPR) angle dominates when the metal film thickness is greater than the skin depth. The phase measuring sensitivity at the SPR angle is higher than that at the critical angle by 1 order.

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© 2006 Society of Photo-Optical Instrumentation Engineers

Citation

Kun-Huang Chen ; Jing-Heng Chen and Jiun-You Lin
"Comparison of Kretschmann-Raether configuration angular and thickness regimes with phase-difference shift for measuring changes in refractive index", Opt. Eng. 45(2), 023803 (February 14, 2006). ; http://dx.doi.org/10.1117/1.2172346


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