Optical characterization of Ag–Sb–Te chalcogenide thin films

Yagyadeva D. Sharma; Promod K. Bhatnagar

doi:10.1117/1.2181586

1 March 2006 Optical characterization of Ag–Sb–Te chalcogenide thin films

Yagyadeva D. Sharma, Promod K. Bhatnagar

Author Affiliations +

Optical Engineering, Vol. 45, Issue 3, 033801 (March 2006). https://doi.org/10.1117/1.2181586

Abstract

A systematic investigation of Ag_xSb_2(1–x)Te_3(1–x) (x=0.16, 0.18, and 0.20) is reported. The optical properties of the material were studied using a UV spectrophotometer. The optical behavior of a material is generally utilized to determine its optical constants such as reflectance, transmittance, and optical band gap E₀. The value of E₀ is estimated for these samples by measuring the absorption coefficient as a function of the wavelength of light in the range 300 to 1400 nm. Films of different Ag content were studied both before and after annealing. It was concluded that this material is a candidate for phase change optical memory.

©(2006) Society of Photo-Optical Instrumentation Engineers (SPIE)

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Yagyadeva D. Sharma and Promod K. Bhatnagar "Optical characterization of Ag–Sb–Te chalcogenide thin films," Optical Engineering 45(3), 033801 (1 March 2006). https://doi.org/10.1117/1.2181586

Published: 1 March 2006

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