Optical Fabrication

Measurement of refractive indices of 20 optical materials at low temperatures

[+] Author Affiliations
Tomoyasu Yamamuro

Nagoya University, Department of Astrophysics, Chikusa-ku, Nagoya 464-8602, Japan

Shuji Sato

Nagoya University, Department of Astrophysics, Chikusa-ku, Nagoya 464-8602, Japan

Takahiro Zenno

Nagoya University, Department of Astrophysics, Chikusa-ku, Nagoya 464-8602, Japan

Norihide Takeyama

Genesia Corporation, 3-38-4-601, Shimorenjaku, Mitaka-shi, Tokyo 181-0013, Japan

Hideo Matsuhara

Nagoya University, Department of Astrophysics, Chikusa-ku, Nagoya 464-8602, Japan

Ippei Maeda

Tokyo Metropolitan Institute of Technology, 6-6 Asahigaoka, Hino-shi, Tokyo 191-0065, Japan

Yoshio Matsueda

Shimadzu Device Corporation, Kalnew-Iida Works, 250 Tokimata, Iida-shi, Nagano 399-2563, Japan

Opt. Eng. 45(8), 083401 (August 22, 2006). doi:10.1117/1.2336241
History: Received November 01, 2005; Revised January 16, 2006; Accepted January 20, 2006; Published August 22, 2006
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We build a refractometer capable of measuring refractive indices at low temperatures from visible to near-infrared wavelength. Refractive indices of 20 optical materials (three fluorides, 15 glasses, fused silica, and KRS-5) are measured at wavelengths of 365.0, 435.8, 546.1, 1014.0, 1529.6, 2122, and 3298nm at temperatures of 80, 120, 180, 240, and 293K. The temperature dependences of the refractive indices are shown in a table and figures.

Figures in this Article
© 2006 Society of Photo-Optical Instrumentation Engineers

Citation

Tomoyasu Yamamuro ; Shuji Sato ; Takahiro Zenno ; Norihide Takeyama ; Hideo Matsuhara, et al.
"Measurement of refractive indices of 20 optical materials at low temperatures", Opt. Eng. 45(8), 083401 (August 22, 2006). ; http://dx.doi.org/10.1117/1.2336241


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