1 August 2007 Two-step triangular-pattern phase-shifting method for three-dimensional object-shape measurement
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Abstract
Existing phase-shifting measurement methods involve processing of three acquired images or computation of functions that require more complex processing than linear functions. This paper presents a novel two-step triangular-pattern phase-shifting method of 3-D object-shape measurement that combines advantages of earlier techniques. The method requires only two image-acquisition steps to capture two images, and involves projecting linear grayscale-intensity triangular patterns that require simpler computation of the intensity ratio than methods that use sinusoidal patterns. A triangular intensity-ratio distribution is computed from two captured phase-shifted triangular-pattern images. An intensity ratio-to-height conversion algorithm, based on traditional phase-to-height conversion in the sinusoidal-pattern phase-shifting method, is used to reconstruct the object 3-D surface geometry. A smaller pitch of the triangular pattern resulted in higher measurement accuracy; however, an optimal pitch was found, below which intensity-ratio unwrapping failure may occur. Measurement error varied cyclically with depth and may partly be due to projector gamma nonlinearity and image defocus. The use of only two linear triangular patterns in the proposed method has the advantage of less processing than current methods that process three images, or methods that process more complex functions than the intensity ratio. This would be useful for high speed or real-time 3-D object-shape measurement.
©(2007) Society of Photo-Optical Instrumentation Engineers (SPIE)
Peirong Jia, Jonathan Kofman, and Chad E. English "Two-step triangular-pattern phase-shifting method for three-dimensional object-shape measurement," Optical Engineering 46(8), 083201 (1 August 2007). https://doi.org/10.1117/1.2768616
Published: 1 August 2007
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Cited by 54 scholarly publications.
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KEYWORDS
Phase shifts

Projection systems

Image processing

3D metrology

3D modeling

Fringe analysis

Calibration

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