Integrated Optics

Precision measurements for propagation properties of high-definition polymer waveguides by imaging of scattered light

[+] Author Affiliations
Fengtao Wang

Georgia Institute of Technology, Packaging Research Center, Atlanta, Georgia 30332

Fuhan Liu

Georgia Institute of Technology, Packaging Research Center, Atlanta, Georgia 30332

Gee-Kung Chang

Georgia Institute of Technology, Packaging Research Center, Atlanta, Georgia 30332

Ali Adibi

Georgia Institute of Technology, Packaging Research Center, Atlanta, Georgia 30332

Opt. Eng. 47(2), 024602 (February 15, 2008). doi:10.1117/1.2842390
History: Received May 15, 2007; Revised October 03, 2007; Accepted October 05, 2007; Published February 15, 2008
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Abstract

We present a reliable, nondestructive, and real-time technique for characterization of propagation properties of planar optical waveguides based on accurately imaging the scattered light from the optical waveguide using a sensitive charge-coupled device (CCD) camera with built-in integration functionality. This technique can be used for real-time investigation of the propagation properties (loss, mode profile, bending properties, etc.) as well as the fabrication quality of planar optical waveguides. With this technique, we evaluate high-definition polymer optical waveguides on printed circuit board (PCB) substrates with a very low loss of 0.065dBcm at a wavelength of 850nm, and measurement accuracy is less than 0.01dBcm. We expect this technique with the given CCD camera to be suitable for reliably measuring loss coefficients well below 0.1dBcm.

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© 2008 Society of Photo-Optical Instrumentation Engineers

Citation

Fengtao Wang ; Fuhan Liu ; Gee-Kung Chang and Ali Adibi
"Precision measurements for propagation properties of high-definition polymer waveguides by imaging of scattered light", Opt. Eng. 47(2), 024602 (February 15, 2008). ; http://dx.doi.org/10.1117/1.2842390


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