Instrumentation, Measurement, and Metrology

Figures of merit and optimization of a VO2 microbolometer with strong electrothermal feedback

[+] Author Affiliations
Gilson Neto, L. Alberto L. de Almeida

Universidade Federal da Bahia,Department of Electrical Engineering, Salvador—BA, Brazil

Antonio M. N. Lima, Cleumar S. Moreira, Helmut Neff

Universidade Federal de Campina Grande,Center for Electrical Engineering and Informatics, Department of Electrical Engineering, 58109-000 Campina Grande—PB, Brazil

Igor A. Khrebtov, Valery G. Malyarov

State Scientific Center of the Russian Federation, Vavilov Optical Institute,St. Petersburg, Russia

Opt. Eng. 47(7), 073603 (July 29, 2008). doi:10.1117/1.2956386
History: Received October 28, 2007; Revised May 03, 2008; Accepted May 11, 2008; Published July 29, 2008
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The influence of electrothermal feedback and hysteresis on the operation conditions, noise, and performance of a VO2 transition-edge microbolometer has been evaluated. The material undergoes a first-order semiconductor-to-metal phase transition (SMT) within the temperature range 40<T<70°C. Due to electrothermal feedback, all device parameters, including the required heat-sink temperature, output voltage and current response, response time, linear dynamic range, responsivity, noise, and detectivity, display complex and nonlinear variations with temperature, electrical biasing conditions, input radiation levels, and hysteresis width. In the constant-current mode, the device responsivity extends over a broad temperature range, but under constant-voltage operation it is sharply localized and restricted to the SMT center. Film quality, as represented by the transition and the hysteresis width and the flicker noise magnitude, crucially affects device performance. In the weak hysteretic case and at low 1f noise levels, the device detectivity improves substantially in both operation modes. The spectral range of the device is largely determined by the optical absorptivity of the VO2 film. For operation within the SMT, it extends well into the far IR wavelength region of the atmospheric window, but is substantially smaller for operation in the semiconducting region.

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© 2008 Society of Photo-Optical Instrumentation Engineers

Citation

Gilson Neto ; L. Alberto L. de Almeida ; Antonio M. N. Lima ; Cleumar S. Moreira ; Helmut Neff, et al.
"Figures of merit and optimization of a VO2 microbolometer with strong electrothermal feedback", Opt. Eng. 47(7), 073603 (July 29, 2008). ; http://dx.doi.org/10.1117/1.2956386


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