Effect of elliptical manufacture error of an axicon on the diffraction-free beam patterns

Xiahui Zeng; Fengtie Wu

doi:10.1117/1.2967867

1 August 2008 Effect of elliptical manufacture error of an axicon on the diffraction-free beam patterns

Xiahui Zeng, Fengtie Wu

Author Affiliations +

Optical Engineering, Vol. 47, Issue 8, 083401 (August 2008). https://doi.org/10.1117/1.2967867

Abstract

Based on the generalized Huygens-Fresnel diffraction integral theory and the stationary-phase method, we analyze the influence on diffraction-free beam patterns of an elliptical manufacture error in an axicon. The numerical simulation is compared with the beam patterns photographed by using a CCD camera. Theoretical simulation and experimental results indicate that the intensity of the central spot decreases with increasing elliptical manufacture defect and propagation distance. Meanwhile, the bright rings around the central spot are gradually split into four or more symmetrical bright spots. The experimental results fit the theoretical simulation very well.

©(2008) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

Xiahui Zeng and Fengtie Wu "Effect of elliptical manufacture error of an axicon on the diffraction-free beam patterns," Optical Engineering 47(8), 083401 (1 August 2008). https://doi.org/10.1117/1.2967867

Published: 1 August 2008

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