Instrumentation, Measurement, and Metrology

Alignment procedure for radiation pattern measurements of antenna-coupled infrared detectors

[+] Author Affiliations
Peter M. Krenz

University of Central Florida,CREOL, The College of Optics and Photonics, 4000 Central Florida Boulevard, Orlando, Florida 32816

Brian A. Slovick

University of Central Florida,CREOL, The College of Optics and Photonics, 4000 Central Florida Boulevard, Orlando, Florida 32816

Jeffrey A. Bean

University of Central Florida,CREOL, The College of Optics and Photonics, 4000 Central Florida Boulevard, Orlando, Florida 32816

Glenn D. Boreman

University of Central Florida,CREOL, The College of Optics and Photonics, 4000 Central Florida Boulevard, Orlando, Florida 32816

Opt. Eng. 49(3), 033607 (March 23, 2010). doi:10.1117/1.3365959
History: Received December 03, 2009; Accepted February 01, 2010; Published March 23, 2010; Online March 23, 2010
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An antenna-coupled detector’s directional properties can be verified by measuring its angular radiation pattern. At infrared frequencies, this pattern can be measured by rotating the device while illuminating it with a laser beam. An accurate radiation pattern can be measured only if the device is coaligned with the axis of rotation and the focus of the laser beam. In the alignment procedure presented, the device is rotated to various angles and the distance along the orthogonal axis from the current device position to the laser beam is measured by maximizing its response. Calculations based on these distances provide the new location of the device, which will coalign it with the axis of rotation and the focus of the laser beam. The successful alignment enables accurate radiation pattern measurements.

Figures in this Article
© 2010 Society of Photo-Optical Instrumentation Engineers

Citation

Peter M. Krenz ; Brian A. Slovick ; Jeffrey A. Bean and Glenn D. Boreman
"Alignment procedure for radiation pattern measurements of antenna-coupled infrared detectors", Opt. Eng. 49(3), 033607 (March 23, 2010). ; http://dx.doi.org/10.1117/1.3365959


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