SPECKLE INTERFEROMETRY

Comparative study of wavelet thresholding methods for denoising electronic speckle pattern interferometry fringes

[+] Author Affiliations
Alejandro Federico

Instituto Nacional de Tecnologi´a Industrial, Centro de Investigacio´n y Desarrollo en Fi´sica, CC B1650WAB, CP B1650KNA?San Marti´n, Argentina E-mail: federico@inti.gov.ar

Guillermo H. Kaufmann

Instituto de Fi´sica de Rosario (CONICET-UNR), and Universidad Nacional de Rosario, Departamento de Fi´sica, Facultad de Ciencias Exactas, Ingenieri´a y Agrimensura, 2000?Rosario, Argentina

Opt. Eng. 40(11), 2598-2604 (Nov 01, 2001). doi:10.1117/1.1412616
History: Received Sep. 18, 2000; Revised Mar. 27, 2001; Accepted May 3, 2001
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This paper presents a comparative study of different thresholding methods for speckle noise reduction in electronic speckle pattern interferometry fringes using several wavelet bases. An approach based on the removal of the wavelet subbands of the transformed image is presented. The performance of this method is analyzed and compared with the results obtained with the denoising techniques that use wavelet shrinkage. It is shown that the wavelet subband removal method reduces speckle noise and maintains image features more effectively than the wavelet shrinkage techniques based on soft and hard thresholding. © 2001 Society of Photo-Optical Instrumentation Engineers.

© 2001 Society of Photo-Optical Instrumentation Engineers

Citation

Alejandro Federico and Guillermo H. Kaufmann
"Comparative study of wavelet thresholding methods for denoising electronic speckle pattern interferometry fringes", Opt. Eng. 40(11), 2598-2604 (Nov 01, 2001). ; http://dx.doi.org/10.1117/1.1412616


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