Identification of primary aberrations on a lateral shearing interferogram of optical components using neural network

Tae-Seok Yang; Junho Oh

doi:10.1117/1.1418223

1 December 2001 Identification of primary aberrations on a lateral shearing interferogram of optical components using neural network

Tae-Seok Yang, Junho Oh

Author Affiliations +

Optical Engineering, Vol. 40, Issue 12, (December 2001). https://doi.org/10.1117/1.1418223

A method is proposed for the identification of primary aberrations with a single image of a lateral shearing interferogram of optical components, obtained from a monochromatic laser source, using a neural network. The neural network is used to illustrate the features of the sampled interferograms and identify the primary aberrations of the other interferograms by means of its excellence in interpolation and extrapolation. Analysis of the pattern is performed to find the proper features to teach the neural network in less time. Simulations are performed to verify the suggested method.

©(2001) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

Tae-Seok Yang and Junho Oh "Identification of primary aberrations on a lateral shearing interferogram of optical components using neural network," Optical Engineering 40(12), (1 December 2001). https://doi.org/10.1117/1.1418223

Published: 1 December 2001

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available