Analytical study on junction detection

Jiann-Shu Lee; Jzau-Sheng Lin; Ching-Tsorng Tsai; Ding-Horng Chen

doi:10.1117/1.1430725

1 February 2002 Analytical study on junction detection

Jiann-Shu Lee, Jzau-Sheng Lin, Ching-Tsorng Tsai, Ding-Horng Chen

Optical Engineering, Vol. 41, Issue 2, (February 2002). https://doi.org/10.1117/1.1430725

Junctions convey rich information and are often used to identify objects in the scene or for stereoscopic matching or displacement vector measuring. In a previous work, an accurate wavelet-based corner detection method has been proposed. This work is an extension of the work on junction characterization and detection in real images. We first perform an analytical study for a general junction model that allows us to better understand the behavior of junctions in the wavelet domain. Two new properties, including the scale proportion property of the modulus and the scale invariant property of orientation in the wavelet domain, are derived. These properties are applied to accurately detect junctions. Several promising experimental results have been carried out using noisy and noisy-free real images. These results show that our approach is a general methodology for accurate detection of discrete surface intersection.

©(2002) Society of Photo-Optical Instrumentation Engineers (SPIE)

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Jiann-Shu Lee, Jzau-Sheng Lin, Ching-Tsorng Tsai, and Ding-Horng Chen "Analytical study on junction detection," Optical Engineering 41(2), (1 February 2002). https://doi.org/10.1117/1.1430725

Published: 1 February 2002

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KEYWORDS

Wavelets

Wavelet transforms

Edge detection

Optical engineering

Signal to noise ratio

Corner detection

Image processing

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