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SPECIAL SECTION ON POLARIZATION

Spectropolarimetric reflectometer

[+] Author Affiliations
Dennis H. Goldstein

Air Force Research Laboratory, 101 W. Eglin Blvd Suite 280, Eglin Air Force Base, Florida 32542 E-mail: dennis.goldstein@eglin.af.mil

David B. Chenault

SY Technology, Inc., 654 Discovery Drive, Huntsville, Alabama 35806

Opt. Eng. 41(5), 1013-1020 (May 01, 2002). doi:10.1117/1.1467933
History: Received Sep. 5, 2001; Revised Nov. 28, 2001; Accepted Dec. 4, 2001; Online April 26, 2002
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An instrument is presented that combines the functions of a reflectometer, a spectrometer, and a polarimeter. A Fourier transform spectrometer serves as a light source for a dual rotating retarder polarimeter. Operation of the instrument results in measurement of the complete Mueller matrix of a sample in reflection over a wide spectral band. Calibration and error compensation is described. Polarization characteristics of materials in reflection are determined. © 2002 Society of Photo-Optical Instrumentation Engineers.

© 2002 Society of Photo-Optical Instrumentation Engineers

Citation

Dennis H. Goldstein and David B. Chenault
"Spectropolarimetric reflectometer", Opt. Eng. 41(5), 1013-1020 (May 01, 2002). ; http://dx.doi.org/10.1117/1.1467933


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