SPECIAL SECTION ON POLARIZATION

Two long-wave infrared spectral polarimeters for use in understanding polarization phenomenology

[+] Author Affiliations
Stephanie H. Sposato, Matthew P. Fetrow

Air Force Research Laboratory, Space Vehicles Directorate, 3550 Aberdeen SE, Kirtland Air Force Base, New Mexico?87117

Kenneth P. Bishop

Applied Technology Associates, 1900 Randolph SE, Albuquerque, New Mexico?87106

Thomas R. Caudill

Air Force Research Laboratory, Space Vehicles Directorate, 3550 Aberdeen SE, Kirtland Air Force Base, New Mexico?87117

Opt. Eng. 41(5), 1055-1064 (May 01, 2002). doi:10.1117/1.1464870
History: Received May 10, 2001; Revised Dec. 7, 2001; Accepted Dec. 10, 2001; Online April 26, 2002
Text Size: A A A

Spectrally varying long-wave infrared (LWIR) polarization measurements can be used to identify materials and to discriminate samples from a cluttered background. Two LWIR instruments have been built and fielded by the Air Force Research Laboratory: a multispectral LWIR imaging polarimeter (LIP) and a full-Stokes Fourier transform infrared (FTIR) spectral polarimeter (FSP), constructed for higher spectral resolution measurements of materials. These two instruments have been built to gain an understanding of the polarization signatures expected from different types of materials in a controlled laboratory and in varying field environments. We discuss the instruments, calibration methods, general operation, and measurements characterizing the emitted polarization properties of materials as a function of wavelength. The results show that we are able to make polarization measurements with a relative accuracy of 0.5% degree of polarization (DOP) between two different instruments that are calibrated with the same techniques, and that these measurements can improve the understanding of polarization phenomenology. © 2002 Society of Photo-Optical Instrumentation Engineers.

© 2002 Society of Photo-Optical Instrumentation Engineers

Citation

Stephanie H. Sposato ; Matthew P. Fetrow ; Kenneth P. Bishop and Thomas R. Caudill
"Two long-wave infrared spectral polarimeters for use in understanding polarization phenomenology", Opt. Eng. 41(5), 1055-1064 (May 01, 2002). ; http://dx.doi.org/10.1117/1.1464870


Access This Article
Sign in or Create a personal account to Buy this article ($20 for members, $25 for non-members).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections

Advertisement
  • Don't have an account?
  • Subscribe to the SPIE Digital Library
  • Create a FREE account to sign up for Digital Library content alerts and gain access to institutional subscriptions remotely.
Access This Article
Sign in or Create a personal account to Buy this article ($20 for members, $25 for non-members).
Access This Proceeding
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).
Access This Chapter

Access to SPIE eBooks is limited to subscribing institutions and is not available as part of a personal subscription. Print or electronic versions of individual SPIE books may be purchased via SPIE.org.