PHASE UNWRAPPING AND RETRIEVAL

Phase unwrapping algorithm based on phase fitting reliability in structured light projection

[+] Author Affiliations
Wan-Song Li, Xian-Yu Su

Sichuan University, Opto-Electronics Department, Chengdu, China, 610064

Opt. Eng. 41(6), 1365-1372 (Jun 01, 2002). doi:10.1117/1.1477439
History: Received Aug. 4, 2000; Revised June 5, 2001; Accepted Dec. 19, 2001; Online May 22, 2002
Text Size: A A A

A new improved unwrapping algorithm based on the combination of modulation and phase fitting reliability is presented. In a 3-D sensing technology with structured light projection, for the measurement of a surface with complex reflectivity and a quasisanded object, noises such as saturation/cut-off and quasispeckle in the fringe images are important error sources. The phase unwrapping algorithm based only on fringe modulation is not enough to bypass these error points. The characteristics of the phase measurement errors caused by saturation/cut-off are analyzed, and a new phase reliability criterion that is sensitive to both modulation and some intensity noises is defined to reduce the unwrapping errors. With this new reliability criterion and “flood” unwrapping algorithm, the phase unwrapping can be implemented along a more reliable path and errors are limited in the minimum areas. © 2002 Society of Photo-Optical Instrumentation Engineers.

© 2002 Society of Photo-Optical Instrumentation Engineers

Citation

Wan-Song Li and Xian-Yu Su
"Phase unwrapping algorithm based on phase fitting reliability in structured light projection", Opt. Eng. 41(6), 1365-1372 (Jun 01, 2002). ; http://dx.doi.org/10.1117/1.1477439


Tables

Access This Article
Sign in or Create a personal account to Buy this article ($20 for members, $25 for non-members).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections

PubMed Articles
Advertisement
  • Don't have an account?
  • Subscribe to the SPIE Digital Library
  • Create a FREE account to sign up for Digital Library content alerts and gain access to institutional subscriptions remotely.
Access This Article
Sign in or Create a personal account to Buy this article ($20 for members, $25 for non-members).
Access This Proceeding
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).
Access This Chapter

Access to SPIE eBooks is limited to subscribing institutions and is not available as part of a personal subscription. Print or electronic versions of individual SPIE books may be purchased via SPIE.org.