Interferometry

Atomic-resolution measurements with a new tunable diode laser-based interferometer

[+] Author Affiliations
Richard M. Silver

National Institute of Standards and Technology, Precision Engineering Division, Gaithersburg, Maryland 20899

H. Zou

University of Maryland Chemical Physics Program College Park, Maryland 20740

S. Gonda

AIST, Advanced Semiconductor Research Center, Tsukuba Central 3, 1-1 Umezono 1-Chome, Tsukuba, Ibaraki 305-8563, Japan

B. Damazo, J. Jun

National Institute of Standards and Technology, Precision Engineering Division, Gaithersburg, Maryland 20899

C. Jensen

Danish Space Research Institute Juliane Maries Vej 30 DK-2100 Copenhagen ? Denmark

L. Howard

National Institute of Standards and Technology, Precision Engineering Division, Gaithersburg, Maryland 20899

Opt. Eng. 43(1), 79-86 (Jan 01, 2004). doi:10.1117/1.1631002
History: Received Feb. 6, 2003; Revised Jun. 16, 2003; Accepted Jun. 16, 2003; Online February 06, 2004
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We develop a new implementation of a Michelson interferometer designed to make measurements with an uncertainty of less than 20 pm. This new method uses a tunable diode laser as the light source, with the diode laser wavelength continuously tuned to fix the number of fringes in the measured optical path. The diode laser frequency is measured by beating against a reference laser. High-speed, accurate frequency measurements of the beat frequency signal enables the diode laser wavelength to be measured with nominally 20-pm accuracy for the measurements described. The new interferometer design is lightweight and is mounted directly on an ultra-high vacuum scanning tunneling microscope capable of atomic resolution. We report the simultaneous acquisition of an atomic resolution image, while the relative lateral displacement of the tip along the sample distance is measured with the new tunable diode laser Michelson interferometer. © 2004 Society of Photo-Optical Instrumentation Engineers.

© 2004 Society of Photo-Optical Instrumentation Engineers

Citation

Richard M. Silver ; H. Zou ; S. Gonda ; B. Damazo ; J. Jun, et al.
"Atomic-resolution measurements with a new tunable diode laser-based interferometer", Opt. Eng. 43(1), 79-86 (Jan 01, 2004). ; http://dx.doi.org/10.1117/1.1631002


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