Characterization of InGaSb/GaSb p-n photodetectors in the 1.0- to 2.4-µm wavelength range

Tamer F. Refaat; M. Nurul Abedin; Ishwara B. Bhat; Partha S. Dutta; Upendra N. Singh

doi:10.1117/1.1695566

1 May 2004 Characterization of InGaSb/GaSb p-n photodetectors in the 1.0- to 2.4-µm wavelength range

Tamer F. Refaat, M. Nurul Abedin, Ishwara B. Bhat, Partha S. Dutta, Upendra N. Singh

Author Affiliations +

Optical Engineering, Vol. 43, Issue 5, (May 2004). https://doi.org/10.1117/1.1695566

Abstract

Optical and electrical characteristics of InGaSb p-n photodetectors are presented at different temperatures. The device structures were grown on GaSb substrates using organic metal vapor phase epitaxy. Spectral calibration indicates peak responsivity around 2 µm, equivalent to 58% quantum efficiency, with 2.3-µm cutoff at room temperature. Reducing the device temperature increases the responsivity and shifts the cutoff wavelength to a shorter value. Current voltage measurements at different temperatures indicate that tunneling is the primary leakage current mechanism. Assuming Johnson limited performance, detectivity calculations resulted in 4×1010 cm Hz1/2/W indicating that InGaSb is a superior material for 2-µm detection applications.

©(2004) Society of Photo-Optical Instrumentation Engineers (SPIE)

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Tamer F. Refaat, M. Nurul Abedin, Ishwara B. Bhat, Partha S. Dutta, and Upendra N. Singh "Characterization of InGaSb/GaSb p-n photodetectors in the 1.0- to 2.4-µm wavelength range," Optical Engineering 43(5), (1 May 2004). https://doi.org/10.1117/1.1695566

Published: 1 May 2004

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