High-resolution and easily implemented spectral measured system used for optical characterization of optoelectronic materials and devices

Ching-Hwa Ho; Horng-Wen Lee

doi:10.1117/1.1755718

1 July 2004 High-resolution and easily implemented spectral measured system used for optical characterization of optoelectronic materials and devices

Ching-Hwa Ho, Horng-Wen Lee

Author Affiliations +

Optical Engineering, Vol. 43, Issue 7, (July 2004). https://doi.org/10.1117/1.1755718

Abstract

We set up a compact high-resolution linear charge-coupled-device (CCD)-based spectrometer for the characterization of optoelectronic materials and devices. The spectrometer is controlled by a personal computer. Detailed design diagrams of the mechanical structure and electronic hardware are described. Spectral resolution of the CCD measurement system of ~0.7 Å/pixel is determined from spectral calibration using two laser sources. Electroluminescent measurements of several selective optoelectronic components, as well as the transmission measurements of GaSe and GaSe_0.9S_0.1 layered semiconductors, are performed utilizing the new spectrometer. The experimental results are analyzed and discussed.

©(2004) Society of Photo-Optical Instrumentation Engineers (SPIE)

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Ching-Hwa Ho and Horng-Wen Lee "High-resolution and easily implemented spectral measured system used for optical characterization of optoelectronic materials and devices," Optical Engineering 43(7), (1 July 2004). https://doi.org/10.1117/1.1755718

Published: 1 July 2004

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