Optical Components, Detectors, and Displays

Fast ray-tracing methods for LCD backlight simulation using the characteristics of the pattern

[+] Author Affiliations
Won Yong Lee, Tong Kun Lim

Korea University, Seoul, Department of Physics, 136-701, Korea

Yun Woo Lee, In Won Lee

Korea Research Institute of Standards and Science, Daejeon, 305-600, Korea

Opt. Eng. 44(1), 014004 (Dec. 27, 2004). doi:10.1117/1.1814358
History: Received May 6, 2003; Revised Mar. 16, 2004; Accepted Jun. 2, 2004; Dec. 27, 2004; Online December 27, 2004
Text Size: A A A

We develop fast ray-tracing methods for LCD backlight simulation. In general, the LCD backlight uses the light guide plate (LGP) to deliver the lights from the side of backlight to the viewing surface. The printed pattern, which consists of many scattering elements (dots), makes the uniform light distribution on the viewing surface. These dots are distributed in a certain regular array at the bottom of the LGP. Since there are too many dots to be handled, it takes a long time for nonsequential Monte Carlo ray-tracing simulations. To speed up the simulation of the backlight with a printed pattern we use a restricted condition and two fast calculation algorithms for the pattern. From the restricted condition, the ray tracing for pattern is performed only when the ray meets the pattern surface. We use two different fast calculation algorithms to verify whether or not a ray meets the pattern. In the first one, since the probability that a ray meets the pattern is the same as the pattern density at the meeting position, we use the pattern density function as a probability function of meeting. This method makes it possible to speed up the simulation and has another merit that the simulation can be processed without using the pattern data: positions, sizes, and the shape of the pattern elements. In the second one, instead of the great number of dots, we determine four dots that can possibly meet a ray. This method gives faster simulation speed and the same result as that from the calculation with all the dots. © 2005 Society of Photo-Optical Instrumentation Engineers.

© 2005 Society of Photo-Optical Instrumentation Engineers

Citation

Won Yong Lee ; Tong Kun Lim ; Yun Woo Lee and In Won Lee
"Fast ray-tracing methods for LCD backlight simulation using the characteristics of the pattern", Opt. Eng. 44(1), 014004 (Dec. 27, 2004). ; http://dx.doi.org/10.1117/1.1814358


Access This Article
Sign in or Create a personal account to Buy this article ($20 for members, $25 for non-members).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections

Advertisement


  • Don't have an account?
  • Subscribe to the SPIE Digital Library
  • Create a FREE account to sign up for Digital Library content alerts and gain access to institutional subscriptions remotely.
Access This Article
Sign in or Create a personal account to Buy this article ($20 for members, $25 for non-members).
Access This Proceeding
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).
Access This Chapter

Access to SPIE eBooks is limited to subscribing institutions and is not available as part of a personal subscription. Print or electronic versions of individual SPIE books may be purchased via SPIE.org.