1 February 2011 Twin-image elimination using quadrantal masks in a digital holographic microscope
Moonseok Kim, Sukjoon Hong, Seongbo Shim, Kwangsup Soh, Younghun Yu, Sanghoon Shin, Jaewan Kim, Jaisoon Kim
Author Affiliations +
Abstract
Holography has a considerable advantage of retrieving three-dimensional information of an object from only one interference recording. However, twin images always appear in the reconstruction for the reason of symmetry. Especially, twin images significantly deteriorate the quality of the reconstructed information in on-axis configuration. A solution of the twin-image problem in a digital holographic microscope by using symmetry with quadrantal masks is suggested in this study. This method is effective to most of the measured area without any additional implements, and restrictions on sample or iterations, and is demonstrated by the simulation and experimental results. The ratio of the disturbed area by a twin-image to the total measured area is reduced to the value of 0.82% in a specific case.
©(2011) Society of Photo-Optical Instrumentation Engineers (SPIE)
Moonseok Kim, Sukjoon Hong, Seongbo Shim, Kwangsup Soh, Younghun Yu, Sanghoon Shin, Jaewan Kim, and Jaisoon Kim "Twin-image elimination using quadrantal masks in a digital holographic microscope," Optical Engineering 50(2), 025801 (1 February 2011). https://doi.org/10.1117/1.3537970
Published: 1 February 2011
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KEYWORDS
Charge-coupled devices

Molybdenum

Digital holography

Holography

Holograms

3D image reconstruction

Microscopes

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