Indium antimonide large-format detector arrays

Mike Davis; Mark E. Greiner

doi:10.1117/1.3590722

1 June 2011 Indium antimonide large-format detector arrays

Mike Davis, Mark E. Greiner

Author Affiliations +

Optical Engineering, Vol. 50, Issue 6, 061016 (June 2011). https://doi.org/10.1117/1.3590722

Abstract

Large format infrared imaging sensors are required to achieve simultaneously high resolution and wide field of view image data. Infrared sensors are generally required to be cooled from room temperature to cryogenic temperatures in less than 10 min thousands of times during their lifetime. The challenge is to remove mechanical stress, which is due to different materials with different coefficients of expansion, over a very wide temperature range and at the same time, provide a high sensitivity and high resolution image data. These challenges are met by developing a hybrid where the indium antimonide detector elements (pixels) are unconnected islands that essentially float on a silicon substrate and form a near perfect match to the silicon read-out circuit. Since the pixels are unconnected and isolated from each other, the array is reticulated. This paper shows that the front side illuminated and reticulated element indium antimonide focal plane developed at L-3 Cincinnati Electronics are robust, approach background limited sensitivity limit, and provide the resolution expected of the reticulated pixel array.

©(2011) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

Mike Davis and Mark E. Greiner "Indium antimonide large-format detector arrays," Optical Engineering 50(6), 061016 (1 June 2011). https://doi.org/10.1117/1.3590722

Published: 1 June 2011

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