Special Section on Advances of Optical Metrology in the Transportation Industry

Optical three-dimensional metrology with structured illumination

[+] Author Affiliations
Rainer Tutsch

Institut für Produktionsmesstechnik, TU Braunschweig, Schleinitzstr. 20, D-38106 Braunschweig, Germany

Marcus Petz

Institut für Produktionsmesstechnik, TU Braunschweig, Schleinitzstr. 20, D-38106 Braunschweig, Germany

Marc Fischer

Institut für Produktionsmesstechnik, TU Braunschweig, Schleinitzstr. 20, D-38106 Braunschweig, Germany

Opt. Eng. 50(10), 101507 (June 14, 2011). doi:10.1117/1.3578448
History: Received January 18, 2011; Revised March 24, 2011; Accepted March 25, 2011; Published June 14, 2011; Online June 14, 2011
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A variety of techniques have been developed to measure the three-dimensional shape of an object using structured illumination. The measurement of objects with diffusely reflecting surfaces by means of projected patterns can be considered a standard technique. Also more recently, methods for the measurement of specularly reflecting or transparent surfaces by evaluation of the images of regular patterns have been published. In this paper, we suggest a systematic treatment of all of these methods as generalized active or passive triangulation techniques.

© 2011 Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation

Rainer Tutsch ; Marcus Petz and Marc Fischer
"Optical three-dimensional metrology with structured illumination", Opt. Eng. 50(10), 101507 (June 14, 2011). ; http://dx.doi.org/10.1117/1.3578448


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