Standardized Total Integrated Scatter Measurements Of Optical Surfaces

John A. Detrio; Susan M. Miner

doi:10.1117/12.7973499

1 June 1985 Standardized Total Integrated Scatter Measurements Of Optical Surfaces

John A. Detrio, Susan M. Miner

Author Affiliations +

Optical Engineering, Vol. 24, Issue 3, 243419 (June 1985). https://doi.org/10.1117/12.7973499

Abstract

In response to the need for specifying the microroughness of optical surfaces, a standard test method for measuring the effective surface roughness of metallized mirrors by total integrated scattering was developed and tested under the auspices of the American Society for Testing and Materials. The "precision" of the test was found to be better than ±15% by an interlaboratory round-robin test program.

Citation Download Citation

John A. Detrio and Susan M. Miner "Standardized Total Integrated Scatter Measurements Of Optical Surfaces," Optical Engineering 24(3), 243419 (1 June 1985). https://doi.org/10.1117/12.7973499

Published: 1 June 1985

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available