11 June 2012 Surface registration-based stitching of quasi-planar free-form wavefronts
Shanyong Chen, Yifan Dai, Shengyi Li, Feng Shi, Yanglin Peng
Author Affiliations +
Abstract
Due to the lateral alignment incapability of planar subaperture stitching algorithms, subaperture testing (SAT) is still challenging especially for quasi-planar free-form wavefronts featured with vertical fluctuation of small amplitude and high frequency. To avoid the lateral misalignment-induced error, we propose a stitching algorithm with quasi-planar free-form surface registration. The subapertures are considered as three-dimensional point sets acquired from a free-form surface instead of the error surface superposed on a plane. Then all subapertures are stitched together by minimizing the deviations among overlaps with regard to the free-form surface. Finally cross-test simulations and experiments are presented to show the effect of error reductions in SAT of large continuous phase plate wavefronts, verified by the full-aperture testing with a large-aperture interferometer.
© 2012 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2012/$25.00 © 2012 SPIE
Shanyong Chen, Yifan Dai, Shengyi Li, Feng Shi, and Yanglin Peng "Surface registration-based stitching of quasi-planar free-form wavefronts," Optical Engineering 51(6), 063605 (11 June 2012). https://doi.org/10.1117/1.OE.51.6.063605
Published: 11 June 2012
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CITATIONS
Cited by 4 scholarly publications.
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KEYWORDS
Wavefronts

Interferometers

Optical engineering

Image registration

Optical testing

Distance measurement

Error analysis

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