11 June 2012 Compressive passive millimeter wave imaging with extended depth of field
Vishal M. Patel, Joseph N. Mait
Author Affiliations +
Abstract
We introduce a millimeter wave imaging modality with extended depth-of-field that provides diffraction-limited images with reduced-spatial sampling. The technique uses a cubic phase element in the pupil of the system and a nonlinear recovery algorithm to produce images that are insensitive to object distance. We present experimental results that validate system performance and demonstrate a greater than four-fold increase in depth-of-field with a reduction in sampling requirements by a factor of at least two.
© 2012 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2012/$25.00 © 2012 SPIE
Vishal M. Patel and Joseph N. Mait "Compressive passive millimeter wave imaging with extended depth of field," Optical Engineering 51(9), 091610 (11 June 2012). https://doi.org/10.1117/1.OE.51.9.091610
Published: 11 June 2012
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CITATIONS
Cited by 15 scholarly publications.
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KEYWORDS
Imaging systems

Passive millimeter wave imaging

Focus stacking

Point spread functions

Extremely high frequency

Millimeter wave imaging

Error analysis

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