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Instrumentation, Measurement, and Metrology

Fourier transform profilometry using a binary area modulation technique

[+] Author Affiliations
William Lohry

Iowa State University, Department of Mechanical Engineering, Ames, Iowa, 50011

Song Zhang

Iowa State University, Department of Mechanical Engineering, Ames, Iowa, 50011

Opt. Eng. 51(11), 113602 (Nov 02, 2012). doi:10.1117/1.OE.51.11.113602
History: Received July 5, 2012; Revised September 21, 2012; Accepted October 2, 2012
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Abstract.  A recent study found that it is very difficult to use the squared binary defocusing technique to eliminate the influence of third-order harmonics without compromising fringe quality, and thus it is challenging to utilize Fourier transform profilometry to achieve high-quality three-dimensional measurement. A novel approach is presented to effectively eliminate the third-order harmonics by modulating the squared binary structured patterns. Both simulation and experiments are presented to verify the performance of the proposed technique.

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© 2012 Society of Photo-Optical Instrumentation Engineers

Citation

William Lohry and Song Zhang
"Fourier transform profilometry using a binary area modulation technique", Opt. Eng. 51(11), 113602 (Nov 02, 2012). ; http://dx.doi.org/10.1117/1.OE.51.11.113602


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