Low-frequency noise, microplasma, and electroluminescence measurements as faster tools to investigate quality of monocrystalline-silicon solar cells

Zdenek Chobola M.D.; Miroslav Lunak; Jiri Vanek; Radim Barinka

doi:10.1117/1.OE.52.5.051203

4 March 2013 Low-frequency noise, microplasma, and electroluminescence measurements as faster tools to investigate quality of monocrystalline-silicon solar cells

Zdenek Chobola M.D., Miroslav Lunak, Jiri Vanek, Radim Barinka

Author Affiliations +

Optical Engineering, Vol. 52, Issue 5, 051203 (March 2013). https://doi.org/10.1117/1.OE.52.5.051203

Abstract

Two sets of c-Si solar cells varying in front side phosphorus doped emitters were produced by standard screen printing techniques. The first group of samples, 3121, was prepared by a combination of standard washing and a bath with a highly dilute HF before diffusion of n⁺ -emitter. The second group of samples, 3122, was treated only with standard washing. A comparison of solar cell conversion efficiency and results from a noise spectroscopy, microplasma, and electroluminescence presence are presented. As was already shown in previous publications noise spectral density reflects the quality of solar cells, and thus represents an alternative advanced cell diagnostic tool. Our results confirm this relationship and moreover bring clear evidence for the maximum spectral noise voltage density being related to the emitter structure. The best results were reached for the group of solar cells in sample 3122, which was treated only with standard washing.

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Zdenek Chobola M.D., Miroslav Lunak, Jiri Vanek, and Radim Barinka "Low-frequency noise, microplasma, and electroluminescence measurements as faster tools to investigate quality of monocrystalline-silicon solar cells," Optical Engineering 52(5), 051203 (4 March 2013). https://doi.org/10.1117/1.OE.52.5.051203

Published: 4 March 2013

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