16 July 2013 One-dimensional gradient-index metrology based on ray slope measurements using a bootstrap algorithm
Di Lin, James R. Leger, Mint Kunkel, Peter McCarthy
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Abstract
The refractive index profile of one-dimensional gradient-index (GRIN) samples can be measured using the incident and exit beam angles of multiple beams passing through the sample at different positions along the index gradient. Beginning from a region of known refractive index, the collective angular deflection measurement of multiple beams is bootstrapped to compute the index profile of the entire sample. An alternative method using an approximate beam displacement model and a corrective algorithm is also presented. The two techniques are used to measure the index profile of a thick GRIN sample, and experimental results show good agreement with a maximum discrepancy of 1.5×10 [sup]−3 in the calculated index. An index accuracy of 5×10 −4 is predicted for the bootstrap method employing typical micron-level spatial measurements.
© 2013 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2013/$25.00 © 2013 SPIE
Di Lin, James R. Leger, Mint Kunkel, and Peter McCarthy "One-dimensional gradient-index metrology based on ray slope measurements using a bootstrap algorithm," Optical Engineering 52(11), 112108 (16 July 2013). https://doi.org/10.1117/1.OE.52.11.112108
Published: 16 July 2013
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CITATIONS
Cited by 13 scholarly publications.
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KEYWORDS
Error analysis

GRIN lenses

Ray tracing

Refractive index

Metrology

Computer simulations

Laser beam diagnostics

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