Special Section on High-Speed 3-D Optical Metrology and Applications

Improving the measuring accuracy of structured light measurement system

[+] Author Affiliations
Qi Xue

Xi’an Jiaotong University, State Key Laboratory for Manufacturing Systems Engineering, No. 28, Xianning West Road, Xi’an, Shaanxi 710049, China

Zhao Wang

Xi’an Jiaotong University, State Key Laboratory for Manufacturing Systems Engineering, No. 28, Xianning West Road, Xi’an, Shaanxi 710049, China

Junhui Huang

Xi’an Jiaotong University, State Key Laboratory for Manufacturing Systems Engineering, No. 28, Xianning West Road, Xi’an, Shaanxi 710049, China

Jianmin Gao

Xi’an Jiaotong University, State Key Laboratory for Manufacturing Systems Engineering, No. 28, Xianning West Road, Xi’an, Shaanxi 710049, China

Opt. Eng. 53(11), 112204 (Mar 31, 2014). doi:10.1117/1.OE.53.11.112204
History: Received January 7, 2014; Revised February 22, 2014; Accepted February 25, 2014
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Abstract.  A method for improving the measuring accuracy of structured light measurement system, which adopts projecting stripe pattern to measure the three-dimensional profile, is presented. Based on the evaluation of the reliability of center extraction results, the improvement of accuracy is achieved by identifying and rejecting the stripe center extraction results with large error. Two parameters are used to evaluate the reliability of center extraction results. The first parameter is the average energy of the stripe, which is used to analyze and establish the relationship between the extraction accuracy and the signal-to-noise ratio through a statistical method. The second parameter is the asymmetric degree of the stripe gray distribution which introduces error into the center extraction, and a new method is proposed for measuring the asymmetric degree. Then, the criteria of the data rejection defined by the thresholds are presented, and large error data with low reliability are identified according to the thresholds. Higher measuring accuracy is achieved by rejecting the identified data. The validity of the method has been proved by experiments.

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© 2014 Society of Photo-Optical Instrumentation Engineers

Citation

Qi Xue ; Zhao Wang ; Junhui Huang and Jianmin Gao
"Improving the measuring accuracy of structured light measurement system", Opt. Eng. 53(11), 112204 (Mar 31, 2014). ; http://dx.doi.org/10.1117/1.OE.53.11.112204


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