Special Section on Optical Fabrication, Testing, and Metrology

Knife edge interferometer, part I: with collimated beam

[+] Author Affiliations
Pedro Cebrian Xochihuila, Nikolai Korneev Zabello, Fermín S. Granados Agustín, Alejandro Cornejo-Rodríguez

Instituto Nacional de Astrofísica Óptica y Electrónica, Apdo. Postal 51 and 216 Puebla, PUE 7200, Mexico

Rufino Díaz-Uribe

Universidad Nacional Autónoma de México, Centro de Ciencias Aplicadas y Desarrollo Tecnológico, Apdo. Postal 70-186, México D.F., C.P. 0451, Mexico

Opt. Eng. 53(9), 092006 (May 13, 2014). doi:10.1117/1.OE.53.9.092006
History: Received December 6, 2013; Revised March 12, 2014; Accepted March 27, 2014
Text Size: A A A

Abstract.  Some experimental qualitative results are presented with a setup that uses a knife edge for producing partial interferograms, in order to obtain the quality of a lens under test. However, the same method can be extended to test an optical surface. The knife edge is located near the focal point of the lens, covering almost half of the incident laser light beam. The different observed interferograms correspond to the orientation of the knife edge with respect to the optical axis, and its distance to the focus of the lens.

Figures in this Article
© 2014 Society of Photo-Optical Instrumentation Engineers


Access This Article
Sign in or Create a personal account to Buy this article ($20 for members, $25 for non-members).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections

Advertisement
  • Don't have an account?
  • Subscribe to the SPIE Digital Library
  • Create a FREE account to sign up for Digital Library content alerts and gain access to institutional subscriptions remotely.
Access This Article
Sign in or Create a personal account to Buy this article ($20 for members, $25 for non-members).
Access This Proceeding
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).
Access This Chapter

Access to SPIE eBooks is limited to subscribing institutions and is not available as part of a personal subscription. Print or electronic versions of individual SPIE books may be purchased via SPIE.org.