21 May 2014 Large-field high-resolution Kirkpatrick–Baez amélioré-Kirkpatrick–Baez mixed microscope for multi-keV time-resolved x-ray imaging diagnostics of laser plasma
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Abstract
A large-field high-resolution x-ray microscope was developed for multi-keV time-resolved x-ray imaging diagnostics of laser plasma at the Shenguang-III prototype facility. The microscope consists of Kirkpatrick–Baez amélioré (KBA) bimirrors and a KB single mirror corresponding to the imaging and temporal directions of a streak camera, respectively. KBA bimirrors coated with an Ir single layer were used to obtain high spatial resolutions within the millimeter-range field of view, and a KB mirror coated with Cr/C multilayers was used to obtain a specific spectral resolution around 4.3 keV. This study describes details of the microscope with regard to its optical design, mirror coatings, and assembly method. The experimental imaging results of the grid with 3 to 5 μm spatial resolution are also shown.
© 2014 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2014/$25.00 © 2014 SPIE
Shengzhen Yi, Baozhong Mu, Xin Wang, Zhong Zhang, Jingtao Zhu, Zhanshan Wang, Pengfei He, Zhurong Cao, Jianjun Dong, Shenye Liu, and Yongkun Ding "Large-field high-resolution Kirkpatrick–Baez amélioré-Kirkpatrick–Baez mixed microscope for multi-keV time-resolved x-ray imaging diagnostics of laser plasma," Optical Engineering 53(5), 053114 (21 May 2014). https://doi.org/10.1117/1.OE.53.5.053114
Published: 21 May 2014
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CITATIONS
Cited by 4 scholarly publications.
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KEYWORDS
Microscopes

X-rays

Mirrors

X-ray imaging

Spatial resolution

Reflectivity

Multilayers

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