Special Section on Optical Frequency Combs

Carrier-envelope offset frequency noise analysis in Ti:sapphire frequency combs

[+] Author Affiliations
Denis V. Sutyrin

Università di Firenze, Dipartimento di Fisica e Astronomia and LENS, INFN-Sezione di Firenze, via Sansone 1, 50019 Sesto Fiorentino (Firenze), Italy

Nicola Poli

Università di Firenze, Dipartimento di Fisica e Astronomia and LENS, INFN-Sezione di Firenze, via Sansone 1, 50019 Sesto Fiorentino (Firenze), Italy

Nicolò Beverini

Università di Pisa, Dipartimento di Fisica, Largo Bruno Pontecorvo 3, 56127 Pisa, Italy

Guglielmo M. Tino

Università di Firenze, Dipartimento di Fisica e Astronomia and LENS, INFN-Sezione di Firenze, via Sansone 1, 50019 Sesto Fiorentino (Firenze), Italy

Opt. Eng. 53(12), 122603 (Jul 14, 2014). doi:10.1117/1.OE.53.12.122603
History: Received February 28, 2014; Revised June 19, 2014; Accepted June 23, 2014
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Abstract.  We experimentally study two Ti:sapphire optical frequency comb femtosecond regimes, respectively, with a linear and a nonlinear dependence of the carrier-envelope offset frequency (fCEO) on pump intensity. For both regimes, we study the effect of single- and multimode pump lasers on the fCEO phase noise. We demonstrate that the femtosecond regime is playing a more important role on the fCEO phase noise and stability than the pump laser type.

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© 2014 Society of Photo-Optical Instrumentation Engineers

Citation

Denis V. Sutyrin ; Nicola Poli ; Nicolò Beverini and Guglielmo M. Tino
"Carrier-envelope offset frequency noise analysis in Ti:sapphire frequency combs", Opt. Eng. 53(12), 122603 (Jul 14, 2014). ; http://dx.doi.org/10.1117/1.OE.53.12.122603


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