Carrier-envelope offset frequency noise analysis in Ti:sapphire frequency combs

Denis  V. Sutyrin; Nicola Poli; Nicolò Beverini; Guglielmo M. Tino

doi:10.1117/1.OE.53.12.122603

14 July 2014 Carrier-envelope offset frequency noise analysis in Ti:sapphire frequency combs

Denis V. Sutyrin, Nicola Poli, Nicolò Beverini, Guglielmo M. Tino

Author Affiliations +

Optical Engineering, Vol. 53, Issue 12, 122603 (July 2014). https://doi.org/10.1117/1.OE.53.12.122603

Abstract

We experimentally study two Ti:sapphire optical frequency comb femtosecond regimes, respectively, with a linear and a nonlinear dependence of the carrier-envelope offset frequency (f_CEO) on pump intensity. For both regimes, we study the effect of single- and multimode pump lasers on the f_CEO phase noise. We demonstrate that the femtosecond regime is playing a more important role on the f_CEO phase noise and stability than the pump laser type.

Citation Download Citation

Denis V. Sutyrin, Nicola Poli, Nicolò Beverini, and Guglielmo M. Tino "Carrier-envelope offset frequency noise analysis in Ti:sapphire frequency combs," Optical Engineering 53(12), 122603 (14 July 2014). https://doi.org/10.1117/1.OE.53.12.122603

Published: 14 July 2014

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available