Lasers, Fiber Optics, and Communications

Beam uniformity analysis of infrared laser illuminators

[+] Author Affiliations
Toomas H. Allik

Active EO Inc., 903 Dalebrook Drive, Alexandria, Virginia 22308, United States

Roberta E. Dixon

CACI, 10221 Burbeck Road, Fort Belvoir, Virginia 22060, United States

R. Patrick Proffitt, Susan Fung, Len Ramboyong, Thomas J. Soyka

U.S. Army RDECOM CERDEC, Night Vision and Electronic Sensors Directorate, Special Products and Prototyping Division, 10221 Burbeck Road, Fort Belvoir, Virginia 22060-5806, United States

Opt. Eng. 54(2), 026103 (Feb 16, 2015). doi:10.1117/1.OE.54.2.026103
History: Received May 13, 2014; Accepted January 6, 2015
Text Size: A A A

Abstract.  Uniform near-infrared (NIR) and short-wave infrared (SWIR) illuminators are desired in low ambient light detection, recognition, and identification of military applications. Factors that contribute to laser illumination image degradation are high frequency, coherent laser speckle and low frequency nonuniformities created by the laser or external laser cavity optics. Laser speckle analysis and beam uniformity improvements have been independently studied by numerous authors, but analysis to separate these two effects from a single measurement technique has not been published. In this study, profiles of compact, diode laser NIR and SWIR illuminators were measured and evaluated. Digital 12-bit images were recorded with a flat-field calibrated InGaAs camera with measurements at F/1.4 and F/16. Separating beam uniformity components from laser speckle was approximated by filtering the original image. The goal of this paper is to identify and quantify the beam quality variation of illumination prototypes, draw awareness to its impact on range performance modeling, and develop measurement techniques and methodologies for military, industry, and vendors of active sources.

Figures in this Article
© 2015 Society of Photo-Optical Instrumentation Engineers

Citation

Toomas H. Allik ; Roberta E. Dixon ; R. Patrick Proffitt ; Susan Fung ; Len Ramboyong, et al.
"Beam uniformity analysis of infrared laser illuminators", Opt. Eng. 54(2), 026103 (Feb 16, 2015). ; http://dx.doi.org/10.1117/1.OE.54.2.026103


Access This Article
Sign in or Create a personal account to Buy this article ($20 for members, $25 for non-members).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections

Advertisement
  • Don't have an account?
  • Subscribe to the SPIE Digital Library
  • Create a FREE account to sign up for Digital Library content alerts and gain access to institutional subscriptions remotely.
Access This Article
Sign in or Create a personal account to Buy this article ($20 for members, $25 for non-members).
Access This Proceeding
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).
Access This Chapter

Access to SPIE eBooks is limited to subscribing institutions and is not available as part of a personal subscription. Print or electronic versions of individual SPIE books may be purchased via SPIE.org.