Intensity-based method for selection of valid interferometric data in temporal phase shifting interferometry

Jaime Sánchez-Paredes; Gilberto Silva-Ortigoza; Jorge Castro-Ramos

doi:10.1117/1.OE.54.2.024106

18 February 2015 Intensity-based method for selection of valid interferometric data in temporal phase shifting interferometry

Jaime Sánchez-Paredes, Gilberto Silva-Ortigoza, Jorge Castro-Ramos

Author Affiliations +

Optical Engineering, Vol. 54, Issue 2, 024106 (February 2015). https://doi.org/10.1117/1.OE.54.2.024106

Abstract

In this paper, we propose a method to detect the valid phase pixels of fringe patterns obtained with phase shifting interferometry. From a set of simulated interferogram images, we obtain a set of equations to discriminate between valid and invalid wavefront phase pixels, which allow us to compute the wavefront aberration. This method is useful for testing any converging optical system in a quantitative way with either a small or large focal ratio, with either polished or rough surfaces and with wavefront or lateral shear interferograms.

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Jaime Sánchez-Paredes, Gilberto Silva-Ortigoza, and Jorge Castro-Ramos "Intensity-based method for selection of valid interferometric data in temporal phase shifting interferometry," Optical Engineering 54(2), 024106 (18 February 2015). https://doi.org/10.1117/1.OE.54.2.024106

Published: 18 February 2015

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