Instrumentation, Techniques, and Measurement

Intensity-based method for selection of valid interferometric data in temporal phase shifting interferometry

[+] Author Affiliations
Jaime Sánchez-Paredes, Jorge Castro-Ramos

Instituto Nacional de Astrofísica Óptica y Electrónica, Apartado Postal 51 y 216, C.P. 72000, Tonantzintla, Puebla, México

Gilberto Silva-Ortigoza

Facultad de Ciencias Físico Matemáticas de la Benemérita Universidad Autónoma de Puebla, Apartado Postal 1152, Puebla 72001, México

Centro de Investigación y de Estudios Avanzados del I.P.N., Departamento de Física, Apartado Postal 14-740, 07000 México, D. F., México

Opt. Eng. 54(2), 024106 (Feb 18, 2015). doi:10.1117/1.OE.54.2.024106
History: Received August 15, 2014; Accepted January 19, 2015
Text Size: A A A

Abstract.  In this paper, we propose a method to detect the valid phase pixels of fringe patterns obtained with phase shifting interferometry. From a set of simulated interferogram images, we obtain a set of equations to discriminate between valid and invalid wavefront phase pixels, which allow us to compute the wavefront aberration. This method is useful for testing any converging optical system in a quantitative way with either a small or large focal ratio, with either polished or rough surfaces and with wavefront or lateral shear interferograms.

Figures in this Article
© 2015 Society of Photo-Optical Instrumentation Engineers

Citation

Jaime Sánchez-Paredes ; Gilberto Silva-Ortigoza and Jorge Castro-Ramos
"Intensity-based method for selection of valid interferometric data in temporal phase shifting interferometry", Opt. Eng. 54(2), 024106 (Feb 18, 2015). ; http://dx.doi.org/10.1117/1.OE.54.2.024106


Access This Article
Sign in or Create a personal account to Buy this article ($20 for members, $25 for non-members).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections

Advertisement
  • Don't have an account?
  • Subscribe to the SPIE Digital Library
  • Create a FREE account to sign up for Digital Library content alerts and gain access to institutional subscriptions remotely.
Access This Article
Sign in or Create a personal account to Buy this article ($20 for members, $25 for non-members).
Access This Proceeding
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).
Access This Chapter

Access to SPIE eBooks is limited to subscribing institutions and is not available as part of a personal subscription. Print or electronic versions of individual SPIE books may be purchased via SPIE.org.