Imaging Components, Systems, and Processing

Combined denoising filter for fringe pattern in electronic speckle shearing pattern interferometry

[+] Author Affiliations
Jia Dagong, Zhang Yulong, Li Shuai, Zhang Hongxia, Zhang Yimo

Tianjin University, College of Precision Instrument and Opto-electronics Engineering, Ministry of Education, Key Laboratory of Opto-electronics Information Technology, and Key Laboratory of MOEMS, Tianjin 300072, China

Xu Tianhua

University College London, Department of Electronic and Electrical Engineering, Torrington Place, London WC1E 7JE, United Kingdom

Opt. Eng. 54(4), 043105 (Apr 15, 2015). doi:10.1117/1.OE.54.4.043105
History: Received September 9, 2014; Accepted March 6, 2015
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Abstract.  We propose an effective image denoising filter that combines an improved spin filter (ISF) and wave atoms thresholding (WA) to remove the noise of fringe patterns in electronic speckle shearing pattern interferometry. The WA is first employed to denoise the fringe to save the processing time, and then the ISF is further used to remove noise of the denoised image using WA to obtain a better denoising performance. The performance of our proposed approach is evaluated by using both numerically simulated and experimental fringes. At the same time, three figures of merit for denoised fringes are also calculated to quantify the performance of the combined denoising filter. The denoised results produced by ISF, WA, and bilateral filtering are compared. The comparisons show that our proposed method can effectively remove noise and an improvement of 12 s in processing time and 0.3 in speckle index value is obtained with respect to ISF.

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© 2015 Society of Photo-Optical Instrumentation Engineers

Citation

Jia Dagong ; Zhang Yulong ; Li Shuai ; Xu Tianhua ; Zhang Hongxia, et al.
"Combined denoising filter for fringe pattern in electronic speckle shearing pattern interferometry", Opt. Eng. 54(4), 043105 (Apr 15, 2015). ; http://dx.doi.org/10.1117/1.OE.54.4.043105


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