Alternative phase-shifting technique for measuring full-field refractive index

Kun-Huang Chen; Jing-Heng Chen; Jiun-You Lin; Yen-Chang Chu

doi:10.1117/1.OE.54.9.094101

10 September 2015 Alternative phase-shifting technique for measuring full-field refractive index

Kun-Huang Chen, Jing-Heng Chen, Jiun-You Lin, Yen-Chang Chu

Author Affiliations +

Optical Engineering, Vol. 54, Issue 9, 094101 (September 2015). https://doi.org/10.1117/1.OE.54.9.094101

Abstract

This study proposes an alternative and simple method for measuring full-field refractive index. This method is based on the phase-shifting technique with a modulated electro-optical (EO) modulator and the phenomenon of total internal reflection. To this purpose, a linear polarized light is expanded and incident on the interface between the prism and the tested specimen, and the reflected light passes through an analyzer for interference. The phase difference between the s- and p-polarized light is sensitive to the refractive index of the tested specimen when the total internal reflection appears on this interface. Based on this effect, the resulting phase differences make it possible to analyze the refractive index of the tested specimen through a phase-shifting technique with a modulated EO modulator. The feasibility of this method was verified by experiment, and the measurement resolution can reach a value of refractive index unit of at least 3.552×10⁻⁴. This method has advantages of simple installation, ease of operation, and fast measurement.

Chen, Chen, Lin, and Chu: Alternative phase-shifting technique for measuring full-field refractive index

CC BY: © The Authors. Published by SPIE under a Creative Commons Attribution 4.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.

Citation Download Citation

Kun-Huang Chen, Jing-Heng Chen, Jiun-You Lin, and Yen-Chang Chu "Alternative phase-shifting technique for measuring full-field refractive index," Optical Engineering 54(9), 094101 (10 September 2015). https://doi.org/10.1117/1.OE.54.9.094101

Published: 10 September 2015

Access the abstract

JOURNAL ARTICLE
5 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

KEYWORDS

Refractive index

Phase shifts

Modulators

Modulation

Prisms

CMOS cameras

Interferometry

Show All Keywords

RELATED CONTENT

Measurement of two dimensional distribution of temperature with surface plasmon...
Proceedings of SPIE (June 22 2013)

Digital Single Sideband Detection For Interferometric Sensors
Proceedings of SPIE (November 12 1984)

Two-dimensional refractive index distribution measurement of a GRIN lens
Proceedings of SPIE (August 02 2010)

Chirp characteristics of silicon Mach-Zehnder modulators
Proceedings of SPIE (January 07 2011)

Interferometric sensors based on surface plasmon resonance
Proceedings of SPIE (March 26 2002)

Electro-optical glass-NLC light modulator
Proceedings of SPIE (August 02 1995)

Accuracy of a multiple height transfer interferometric technique for absolute...
Proceedings of SPIE (November 28 2011)

Subscribe to Digital Library

Receive Erratum Email Alert

Show All Keywords

Keywords/Phrases

Search In:

Publication Years