Materials, Photonic Devices, and Sensors

Mercury–cadmium–telluride thin layers as subterahertz and infrared detectors

[+] Author Affiliations
Fedir Sizov, Zinoviia Tsybrii, Vyacheslav Zabudsky, Oleksandr Golenkov, Volodymyr Petryiakov, Anna Shevchik-Shekera, Ihor Lysiuk

V.E. Lashkaryov Institute of Semiconductor Physics, 41 pr. Nauky, Kyiv, 03028, Ukraine

Sergey Dvoretsky, Nikolai Michailov

A.V. Rzhanov Institute of Semiconductor Physics, pr. Lavrentieva 13, Novosibirsk 630090, Russia

Ernesto Dieguez

Universidad Autonoma de Madrid, Cantoblanco, Madrid 28049, Spain

Opt. Eng. 54(12), 127102 (Dec 10, 2015). doi:10.1117/1.OE.54.12.127102
History: Received June 10, 2015; Accepted November 10, 2015
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Abstract.  Issues associated with the development and exploitation of infrared (IR) and terahertz (THz) radiation detectors based on a narrow-gap “HgCdTe” semiconductor have been discussed. This mercury–cadmium–telluride (MCT) semiconductor can be applied for two-color detector operation in IR and sub-THz spectral ranges. Two-color uncooled and cooled down to 78 K narrow-gap MCT semiconductor thin layers grown using the liquid phase epitaxy or molecular beam epitaxy methods on high-resistive “CdZnTe” or “GaAs” substrates, with bow-type antennas, have been considered both as sub-THz direct detection bolometers and 3 to 10μm IR photoconductors. Their room temperature noise equivalent power at the frequency ν140GHz and signal-to-noise ratio at the spectral sensitivity maximum under monochromatic (spectral resolution 0.1μm) globar illumination reached the following values; 4.5×1010W/Hz1/2 and 50, respectively. Aspheric lenses used for obtaining the images in the sub-THz spectral region were designed and manufactured. With these detectors, about 140 and 270 GHz imaging data have been demonstrated.

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© 2015 Society of Photo-Optical Instrumentation Engineers

Citation

Fedir Sizov ; Zinoviia Tsybrii ; Vyacheslav Zabudsky ; Oleksandr Golenkov ; Volodymyr Petryiakov, et al.
"Mercury–cadmium–telluride thin layers as subterahertz and infrared detectors", Opt. Eng. 54(12), 127102 (Dec 10, 2015). ; http://dx.doi.org/10.1117/1.OE.54.12.127102


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