Optical Design and Engineering

Application of low-coherence interferometry for in situ nondestructive evaluation of thin and thick multilayered transparent composites

[+] Author Affiliations
Anton Khomenko, Gary Lee Cloud

Michigan State University, Composite Vehicle Research Center, 2727 Alliance Drive, Lansing, Michigan 48910, United States

Mahmoodul Haq

Michigan State University, Composite Vehicle Research Center, 2727 Alliance Drive, Lansing, Michigan 48910, United States

Michigan State University, Department of Civil and Environmental Engineering, 428 South Shaw Lane, East Lansing, Michigan 48824, United States

Opt. Eng. 54(12), 125103 (Dec 16, 2015). doi:10.1117/1.OE.54.12.125103
History: Received September 21, 2015; Accepted November 16, 2015
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Abstract.  Multilayered transparent composites having laminates with polymer interlayers and backing sheets are commonly used in a wide range of applications where visibility, transparency, impact resistance, and safety are essential. Manufacturing flaws or damage during operation can seriously compromise both safety and performance. Most fabrication defects are not discernible until after the entire multilayered transparent composite assembly has been completed, and in-the-field inspection for damage is a problem not yet solved. A robust and reliable nondestructive evaluation (NDE) technique is needed to evaluate structural integrity and identify defects that result from manufacturing issues as well as in-service damage arising from extreme environmental conditions in addition to normal mechanical and thermal loads. Current optical techniques have limited applicability for NDE of such structures. This work presents a technique that employs a modified interferometer utilizing a laser diode or femtosecond fiber laser source to acquire in situ defect depth location inside a thin or thick multilayered transparent composite, respectively. The technique successfully located various defects inside examined composites. The results show great potential of the technique for defect detection, location, and identification in multilayered transparent composites.

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© 2015 Society of Photo-Optical Instrumentation Engineers

Topics

Composites

Citation

Anton Khomenko ; Gary Lee Cloud and Mahmoodul Haq
"Application of low-coherence interferometry for in situ nondestructive evaluation of thin and thick multilayered transparent composites", Opt. Eng. 54(12), 125103 (Dec 16, 2015). ; http://dx.doi.org/10.1117/1.OE.54.12.125103


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