Special Section on Instrumentation and Techniques for Geometrical and Mechanical Quantity Measurement

Optical inspection of smartphone camera modules by near-infrared low-coherence interferometry

[+] Author Affiliations
Chang-Yun Lee

Korea Advanced Institute of Science and Technology, Department of Mechanical Engineering, Science Town, Daejeon 305-701, Republic of Korea

Samsung Electro-Mechanics Co. Ltd., Central R&D Center, Suwon-si, Gyeonggi-do 443-743, Republic of Korea

Sang-Won Hyun

Korea Basic Science Institute, 169-148 Gwahak-ro, Yuseong-gu, Daejeon 34133, Republic of Korea

Young-Jin Kim

Nanyang Technological University, School of Mechanical and Aerospace Engineering, 50 Nanyang Avenue, Singapore 639798, Singapore

Seung-Woo Kim

Korea Advanced Institute of Science and Technology, Department of Mechanical Engineering, Science Town, Daejeon 305-701, Republic of Korea

Opt. Eng. 55(9), 091404 (Mar 14, 2016). doi:10.1117/1.OE.55.9.091404
History: Received December 28, 2015; Accepted February 22, 2016
Text Size: A A A

Abstract.  High-resolution cameras used for smartphones are comprised of multiple aspheric lenses, a spectral filter, and a semiconductor image sensor, which are packaged together into a single module with tight geometrical tolerances. We investigated the technical possibility of near-infrared low-coherence interferometry for nondestructive geometrical inspection of the complex camera module to examine the inside packaging state. This tomographic scheme enabled us to measure the relative axial position of each inside component and also the lateral surface profile of the image sensor, allowing for comprehensive three-dimensional quality assurance of the whole camera module during the packaging process.

Figures in this Article
© 2016 Society of Photo-Optical Instrumentation Engineers

Citation

Chang-Yun Lee ; Sang-Won Hyun ; Young-Jin Kim and Seung-Woo Kim
"Optical inspection of smartphone camera modules by near-infrared low-coherence interferometry", Opt. Eng. 55(9), 091404 (Mar 14, 2016). ; http://dx.doi.org/10.1117/1.OE.55.9.091404


Access This Article
Sign in or Create a personal account to Buy this article ($20 for members, $25 for non-members).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections

Advertisement
  • Don't have an account?
  • Subscribe to the SPIE Digital Library
  • Create a FREE account to sign up for Digital Library content alerts and gain access to institutional subscriptions remotely.
Access This Article
Sign in or Create a personal account to Buy this article ($20 for members, $25 for non-members).
Access This Proceeding
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).
Access This Chapter

Access to SPIE eBooks is limited to subscribing institutions and is not available as part of a personal subscription. Print or electronic versions of individual SPIE books may be purchased via SPIE.org.