Instrumentation, Techniques, and Measurement

Method of alignment error control in free-form surface metrology with the tilted-wave-interferometer

[+] Author Affiliations
Jia Li, Hua Shen, Rihong Zhu

Nanjing University of Science and Technology, School of Electronic Engineering and Photo-Electric Technology, 200 Xiaoling Wei Street, Nanjing, Jiangsu Province 210094, China

Opt. Eng. 55(4), 044101 (Apr 07, 2016). doi:10.1117/1.OE.55.4.044101
History: Received December 21, 2015; Accepted March 14, 2016
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Abstract.  Compared with conventional optical elements, free-form surface optical elements, as a kind of nonrotationally symmetrical shaped component, can provide more freedom in optical design, optimize the structure of the optical system, and improve its performance. However, the difficulties involved in the measurement of free-form elements restrict their manufacture and application. A tilted-wave-interferometer (TWI) can achieve high precision in free-form surface measurement, but it requires higher space attitude error control. We analyze the relation between the alignment error and the measurement error introduced by the misalignment in free-form surface metrology with TWI. The attitude control method in the rotation direction is proposed based on the moire fringe technique. Then, combining it with the five-dimensional space attitude control method of aspherical elements, we put forward an alignment error control process in measuring the free-form surface. An experiment of measuring a free-form surface using TWI shows the effectiveness of our method.

© 2016 Society of Photo-Optical Instrumentation Engineers

Citation

Jia Li ; Hua Shen and Rihong Zhu
"Method of alignment error control in free-form surface metrology with the tilted-wave-interferometer", Opt. Eng. 55(4), 044101 (Apr 07, 2016). ; http://dx.doi.org/10.1117/1.OE.55.4.044101


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